Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.

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Material type: Text

TextSeries: Wiley series in probability and mathematical statistics. Applied probability and statisticsPublication details: New York : Wiley, 1989.Description: xiii, 307 p. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Notes	Date due	Barcode
Book	ENSIGN LIBRARY General Stacks	QA278.2 H79 (Browse shelf(Opens below))	C.1	Available	ekp 15/12/22

"A Wiley-Interscience publication."

Includes bibliographical references (p. 291-300) and index.

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