Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow.

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Material type: Text

TextSeries: Wiley series in probability and statistics. Texts and references sectionPublication details: New York : Wiley, 1999.Description: xiii, 386 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Notes	Date due	Barcode
Book	ENSIGN LIBRARY General Stacks	R853.S7 H79 (Browse shelf(Opens below))	C.1	Available	ekp 08/02/23

"A Wiley-Interscience publication."

Includes bibliographical references (p. 365-377) and index.

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