Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow.

By:

Contributor(s):

Material type:

TextSeries: Wiley series in probability and statistics. Texts and references sectionPublication details: New York : Wiley, 1999.Description: xiii, 386 p. : ill. ; 25 cmISBN:

Subject(s):

DDC classification:

LOC classification:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Book	ENSIGN LIBRARY General Stacks				R853.S7 H79 (Browse shelf(Opens below))				C.1	Available	ekp 08/02/23		00430

"A Wiley-Interscience publication."

Includes bibliographical references (p. 365-377) and index.

There are no comments on this title.

to post a comment.