Hosmer, David W. <br/><br/>
Applied survival analysis :  regression modeling of time to event data / 
David W. Hosmer, Jr., Stanley Lemeshow. 
 - New York :  Wiley,  1999. 
 - xiii, 386 p. :  ill. ;  25 cm. 
 - Wiley series in probability and statistics.  Texts and references section .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references (p. 365-377) and index. 
<br/><br/><label>ISBN: </label>0471154105 (cloth : alk. paper) 
<br/><br/><label>LCCN: </label>98027511  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Medicine--Research--Statistical methods.<br/>Medical sciences--Statistical methods--Computer programs.<br/>Regression analysis--Data processing.<br/>Prognosis--Statistical methods.<br/>Logistic distribution.
<br/><br/><label>LC Class. No.: </label>R853.S7  / H67 1999 
<br/><br/><label>Dewey Class. No.: </label>610/.7/27