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	1.	Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and mathematical statistics. Applied probability and statistics Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Wiley, 1989 Online resources: Publisher description Table of contents only Contributor biographical information Availability: Items available for loan: ENSIGN LIBRARY (1)Call number: QA278.2 H79. Place hold Add to cart (remove)
	2.	Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and statistics. Texts and references section Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Wiley, 1999 Online resources: Contributor biographical information Publisher description Table of Contents Availability: Items available for loan: ENSIGN LIBRARY (1)Call number: R853.S7 H79. Place hold Add to cart (remove)

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